Reflexion and Remission Attachments

Absolute reflectance attachment
V/W optical configuration for the determination of the reflectance at plane surfaces and layers

11°—60° variable angle reflectance attachment
For the examination of solid surfaces, film systems and their interfaces

Reflectance attachment with spectralon integrating sphere
For transmittance and reflectance measurements of solid, powdery and liquid samples

Holder for solid samples
Holds foils, sample plates or similar solid samples for transmittance measurements

Scanning attachment for solid samples
The scanning attachment for solid samples provides locally resolved spectra for large-scale, solid, transparent samples